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The application of synchrotron radiation to X‐ray multiple‐diffraction studies
Author(s) -
Brown B.,
Clark G. F.,
Dineen C.,
Isherwood B. J.,
Pantos E.,
Roberts K. J.,
ScheffenLauenroth T.
Publication year - 1989
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889888013925
Subject(s) - synchrotron radiation , synchrotron , diffraction , optics , materials science , radiation , beam (structure) , x ray , x ray crystallography , high energy x rays , synchrotron radiation source , beamline , physics
Multiple diffraction using parallel‐beam synchrotron X‐radiation is described. Data recorded on the Daresbury Synchrotron Radiation Source from a single‐crystal of InSb are presented and compared with data recorded with the pseudo‐Kossel technique. The wide‐beam synchrotron technique has demonstrated for the first time the feasibility of the synchrotron radiation multiple‐diffraction topographic technique. Potential applications for this technique in the characterization of low‐dimensional structures are outlined.