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Layer thickness determinations with X‐ray diffraction
Author(s) -
Anderson D. E.,
Thomson W. J.
Publication year - 1989
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889888013214
Subject(s) - diffraction , substrate (aquarium) , diffusion , materials science , diffusion equation , absorption (acoustics) , layer (electronics) , x ray crystallography , x ray , crystallography , optics , analytical chemistry (journal) , composite material , thermodynamics , chemistry , physics , geology , chromatography , oceanography , economy , service (business) , economics
A new equation involving an absorption coefficient is presented for calculating the thickness of a layer of a crystalline specimen deposited on a crystalline substrate. This new equation is particularly applicable to in situ X‐ray diffraction studies of diffusion‐limited kinetics; it is demonstrated that the practical difficulty of optimally partitioning count time between the peak of the substrate and peak of the layered specimen is overcome by making use of all available data in this single equation. This can result in more precise thickness determinations for intermediate specimen thicknesses than would be possible with either of the existing methods.