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A transportable surface‐science chamber for glancing‐angle X‐ray diffraction
Author(s) -
Zschack P.,
Cohen J. B.,
Chung Y. W.
Publication year - 1988
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889888005345
Subject(s) - low energy electron diffraction , diffractometer , diffraction , auger electron spectroscopy , materials science , rutile , sputtering , optics , electron diffraction , surface (topology) , physics , scanning electron microscope , chemistry , nuclear physics , thin film , nanotechnology , geometry , mathematics , organic chemistry
A transportable surface‐science chamber has been designed and constructed to mount on a Huber four‐circle diffractometer to perform glancing‐angle X‐ray diffraction from surfaces or near‐surface structures. The chamber permits sputtering and annealing preparation, low‐energy electron diffraction (LEED) and Auger electron spectroscopy (AES). To demonstrate the performance of the instrument, results from a rutile TiO 2 (100) 1 X 3 reconstructed surface are reported.