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X‐ray diffraction line broadening due to dislocations in non‐cubic materials. II. The case of elastic anisotropy applied to hexagonal crystals
Author(s) -
Kužel R.,
Klimanek P.
Publication year - 1988
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988800336x
Subject(s) - anisotropy , diffraction , isotropy , materials science , condensed matter physics , dislocation , hexagonal crystal system , crystallography , cubic crystal system , line (geometry) , orientation (vector space) , optics , geometry , physics , chemistry , mathematics
The calculation of orientation factors determining the anisotropy of dislocation‐induced broadening of X‐ray diffraction lines in crystals is treated for elastically anisotropic materials in terms of a general formalism. The application of the procedure is demonstrated by representation of a computer program and numerical calculations of orientation factors for different slip systems in hexagonal polycrystals with randomly oriented grains. A comparison of the results with those obtained in the approximation of elastic isotropy shows that the anisotropy of the diffraction‐line broadening is essentially caused by the geometrical part of the orientation factor. In most cases the elastic anisotropy of the crystal leads only to small corrections.