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Measurement of intensity of directionally diffuse streaks on a four‐circle diffractometer: divergence correction factors for bisecting setting
Author(s) -
Pandey D.,
Prasad L.,
Lele S.,
Gauthier J. P.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887087089
Subject(s) - streak , divergence (linguistics) , diffractometer , intensity (physics) , optics , beam divergence , point (geometry) , streak camera , physics , metric (unit) , geometry , mathematics , beam diameter , laser beams , scanning electron microscope , laser , philosophy , linguistics , operations management , economics
Because of the inherent beam divergence, point intensities measured using a four‐circle diffractometer at equispaced points along the diffuse streak correspond to variable lengths of the streak. Correction factors required to convert the measured intensities into those corresponding to a fixed length at each equispaced point along the diffuse streak are derived for two different crystal mountings under bisecting geometry. A procedure for experimentally verifying the mathematical approach employed in these calculations is also described.