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Single‐crystal time‐of‐flight neutron diffraction of Cr 3 Si and MnF 2 comparison with monochromatic‐beam techniques
Author(s) -
Jauch W.,
Schultz A. J.,
Heger G.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988708703x
Subject(s) - neutron diffraction , time of flight , diffraction , monochromatic color , materials science , neutron , single crystal , crystal (programming language) , neutron source , beam (structure) , spallation neutron source , optics , analytical chemistry (journal) , crystallography , nuclear physics , physics , chemistry , computer science , programming language , chromatography
Single‐crystal time‐of‐flight (TOF) neutron diffraction data have been collected for Cr 3 Si and MnF 2 with the Argonne Intense Pulsed Neutron Source. The purpose of this study was to test the accuracy of the TOF technique by a comparison with results from recent γ ‐ray, X‐ray and neutron diffraction experiments. The results show that for simple crystal structures the positional and thermal parameters obtained from TOF data approach those obtained by other diffraction methods.