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A simple method of absorption and decay correction in intensities measured by area‐detector X‐ray diffractometer
Author(s) -
Takusagawa F.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887086771
Subject(s) - diffractometer , detector , absorption (acoustics) , simple (philosophy) , optics , physics , symmetry (geometry) , consistency (knowledge bases) , x ray , materials science , mathematics , geometry , scanning electron microscope , philosophy , epistemology
A simple numerical method has been developed to correct for absorption and decay effects in the intensities measured by area‐detector X‐ray diffractometers. Application of this method improves not only the internal consistency of symmetry‐equivalent reflections, but also the agreement between the two independent data sets.