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Angle calculations for a five‐circle diffractometer used for surface X‐ray diffraction
Author(s) -
Vlieg E.,
Van der Veen J. F.,
Macdonald J. E.,
Miller M.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887086527
Subject(s) - diffractometer , diffraction , surface (topology) , orientation (vector space) , optics , x ray crystallography , physics , rod , x ray , geometry , divergence (linguistics) , materials science , crystallography , mathematics , chemistry , scanning electron microscope , linguistics , philosophy , medicine , alternative medicine , pathology
The basic equations are derived for the calculation of the angle settings of a five‐circle diffractometer used for surface X‐ray diffraction. This is done for a specified angle of incidence. An additional constraint that may be imposed is the horizontal alignment of the diffraction rods to match the divergence of the synchrotron X‐ray source or the horizontal setting of the physical surface normal. Alignment procedures and the derivation of the orientation matrix are discussed.