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Equi‐lattice‐spacing mapping X‐ray topography
Author(s) -
Ishikawa T.,
Kitano T.,
Matsui J.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887086503
Subject(s) - lattice (music) , x ray , crystal structure , lattice constant , optics , materials science , geometry , condensed matter physics , physics , crystallography , chemistry , diffraction , mathematics , acoustics
A new X‐ray topographic method is described which images with similar contrast those parts which have the same lattice spacings in an inhomogeneous single‐crystal irrespective of the lattice inclination. This method was applied to GaAs, in which a variation of Δd/d ≲ 10 −5 was topographically resolved.