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Application of X‐ray diffraction topography with a monochromatic divergent beam to the study of distorted crystals
Author(s) -
Polcarová M.,
Brádler J.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988708645x
Subject(s) - monochromatic color , optics , diffraction , beam (structure) , mosaicity , crystal (programming language) , range (aeronautics) , materials science , physics , x ray crystallography , computer science , composite material , programming language
Topography with a monochromatic divergent beam is shown to be a useful method of imaging mosaic and deformed crystals and measuring their distortions. Some properties of the method are derived theoretically and verified experimentally. The focusing of the diffracted beam can take place in one of the possible crystal settings, if appropriate parameters are chosen. Misorientations in a range from several tens of seconds of arc up to several tens of minutes can be measured. Some applications of the method are shown.