Correction of integrated X‐ray intensities for preferred orientation in quantitative phase analysis | Zendy

Valvoda V. | Zendy

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Correction of integrated X‐ray intensities for preferred orientation in quantitative phase analysis

Author(s) -

Valvoda V.

Publication year - 1987

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889887086229

Subject(s) - crystallite , goniometer , orientation (vector space) , materials science , diffractometer , texture (cosmology) , powder diffractometer , diffraction , phase (matter) , crystallography , pole figure , x ray , optics , geometry , physics , mathematics , chemistry , composite material , computer science , image (mathematics) , metallurgy , scanning electron microscope , quantum mechanics , artificial intelligence

A method is presented for the correction of integrated X‐ray intensities for preferred orientation of crystallites in a powder specimen. It is based on knowledge of the relative intensities of reflections of a random specimen on an arbitrary scale; these are supposed to be known in quantitative phase analysis. The orientation distribution of crystallites is represented by a harmonic expansion of which the coefficients can be determined from the intensities of reflections measured in the standard diffraction geometry of a powder diffractometer. The method was tested on a specimen of cubic titanium carbide by comparison with the texture correction obtained from direct examination of the pole‐density distribution measured on a texture goniometer. The results of both methods are in agreement to within 1%.

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