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Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials
Author(s) -
Brakman C. M.
Publication year - 1987
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887086175
Subject(s) - residual stress , diffraction , materials science , isotropy , crystallite , texture (cosmology) , residual , x ray crystallography , phase (matter) , crystallography , stress (linguistics) , reflection (computer programming) , optics , condensed matter physics , composite material , chemistry , mathematics , physics , metallurgy , image (mathematics) , linguistics , organic chemistry , philosophy , algorithm , artificial intelligence , computer science , programming language
Residual stresses in polycrystalline materials can be determined from the 2 θ shift of a reflection peak's line profile. Recently, multiple reflections have been used for residual stress analysis in single‐phase textured cubic materials. Analogously, residual stresses in two‐phase materials could be determined from overlapping peaks of both phases. Equations are derived for residual stress analysis using partially or completely overlapping diffraction peaks. Mainly textured cubic materials are considered. It is shown that the so‐called quasi‐isotropic diffraction elastic constants become connected to texture‐dependent quantities. In the examples treated the calculated diffraction strains of three multiple reflections exhibit only small nonlinearities although the intensities oscillate strongly.