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Analysis of single‐ and double‐crystal spectrometers using three‐dimensional DuMond diagrams and the high‐precision measurement of the Cu Kα 1 line profile
Author(s) -
Xu Shensheng,
Chen Jingyi,
Li Runshen
Publication year - 1988
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887011841
Subject(s) - spectrometer , diagram , line (geometry) , optics , wavelength , resolution (logic) , crystal (programming language) , single crystal , spectral resolution , physics , spectral line , geometry , nuclear magnetic resonance , mathematics , computer science , astronomy , artificial intelligence , programming language , statistics
The general principles of single‐ and double‐crystal spectrometers are described using the three‐dimensional DuMond diagram and new formulae for the resolution of the spectrometers are deduced. A method for measuring the fine structure of spectral lines with high precision is suggested and a generalized method of refraction correction is discussed. The Cu K α line profile is measured carefully by double‐crystal spectrometers using ( n S , n S ) and ( n V , n R ) arrangements, and a hump is found unambiguously on the long‐wavelength side of the Cu K α 1 line.