Analysis of single‐ and double‐crystal spectrometers using three‐dimensional DuMond diagrams and the high‐precision measurement of the Cu Kα 1  line profile | Zendy

Xu Shensheng | Zendy; Chen Jingyi | Zendy; Li Runshen | Zendy

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Analysis of single‐ and double‐crystal spectrometers using three‐dimensional DuMond diagrams and the high‐precision measurement of the Cu Kα 1 line profile

Author(s) -

Xu Shensheng,

Chen Jingyi,

Li Runshen

Publication year - 1988

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889887011841

Subject(s) - spectrometer , diagram , line (geometry) , optics , wavelength , resolution (logic) , crystal (programming language) , single crystal , spectral resolution , physics , spectral line , geometry , nuclear magnetic resonance , mathematics , computer science , astronomy , artificial intelligence , programming language , statistics

The general principles of single‐ and double‐crystal spectrometers are described using the three‐dimensional DuMond diagram and new formulae for the resolution of the spectrometers are deduced. A method for measuring the fine structure of spectral lines with high precision is suggested and a generalized method of refraction correction is discussed. The Cu K α line profile is measured carefully by double‐crystal spectrometers using ( n S , n S ) and ( n V , n R ) arrangements, and a hump is found unambiguously on the long‐wavelength side of the Cu K α 1 line.

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