Premium
The effect of sample position on the determination of triaxial stress by X‐ray diffraction
Author(s) -
Fenn R. H.,
Jones A. M.
Publication year - 1988
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889887008860
Subject(s) - tilt (camera) , diffraction , position (finance) , shear stress , materials science , stress (linguistics) , sample (material) , shear (geology) , displacement (psychology) , diffractometer , optics , analytical chemistry (journal) , physics , chemistry , mathematics , geometry , composite material , thermodynamics , scanning electron microscope , chromatography , psychology , linguistics , philosophy , finance , economics , psychotherapist
The determination of the full three‐dimensional stress tensor in a specimen by X‐ray diffraction requires that the strain be measured with the sample tilted in both a positive and a negative sense for different rotations of the sample in its own plane. The error introduced in the measured strain as a function of the position of the specimen relative to the X‐ray diffractometer axis is investigated and it is shown that the negative tilt values are more sensitive to sample position than the positive tilt values. The determination of the shear stress components uses the difference between the measured strain at equivalent positive and negative tilts and hence it is shown that displacement of the sample could lead to incorrect deductions concerning the presence and magnitude of the shear stress components.