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High‐reflectivity multilayer monochromators for neutrons
Author(s) -
Saxena A. M.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886089811
Subject(s) - reflectivity , optics , materials science , neutron , beam (structure) , sputtering , diffraction , neutron diffraction , optoelectronics , thin film , physics , nanotechnology , nuclear physics
Ni–Ti multilayers were fabricated in an r.f. sputtering system. Reflectivities of the multilayers were measured with a neutron beam having a beam divergence of 0.29 mrad and a beam width of 0.32 mm. Reflectivities of the multilayers and their diffraction properties were compared with results obtained from the dynamical theory for perfect multilayers. Attempts were then made to minimize the imperfections in multilayers and obtain good‐reflectivity multilayers with small d spacings. Multilayers with d spacings from 60 Å up could be fabricated with reflectivities between 0.95 and 1.00.