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Interference line pattern caused by diffuse scattering of X‐rays in a cholesteryl 2,2,3,3‐tetrafluoropropionate (CTFP) crystal
Author(s) -
Yoshimura Y.,
Shimaoka K.,
Nakamura N.,
Yano S.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886089495
Subject(s) - interference (communication) , line (geometry) , reflection (computer programming) , crystal (programming language) , scattering , radiation , optics , materials science , crystallography , chemistry , physics , geometry , channel (broadcasting) , mathematics , computer science , electrical engineering , programming language , engineering
Interference lines similar to Kossel lines have been observed on Laue photographs of a single‐crystal of the title compound. Since the appearance of the lines is temperature dependent, they are interpreted as traces of secondary reflection of thermally scattered radiation from the atomic planes.