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An X‐ray spectrometer for inelastic scattering experiments. I. Curved‐crystal X‐ray optics
Author(s) -
Suortti P.,
Pattison P.,
Weyrich W.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886089264
Subject(s) - optics , spectrometer , monochromatic color , x ray , physics , x ray optics , scattering , silicon , radiation , germanium , crystal (programming language) , inelastic scattering , flux (metallurgy) , radiation flux , diffraction , materials science , optoelectronics , computer science , metallurgy , programming language
The design parameters of an X‐ray spectrometer for inelastic scattering studies are discussed, and a comparison is made of the flux available from various photon sources in the X‐ray region. It is shown that a conventional X‐ray sealed tube can yield a relatively high useful flux, provided monochromatic characteristic radiation over a large solid angle can be collected and focused on the target. A detailed theoretical study is presented of the reflectivity of elastically curved crystals of quartz, silicon and germanium for Cu K α and Mo K α radiation. A phase‐space approach to X‐ray optics proves to be very useful in evaluating the influence of the many geometrical factors. We show how these results can be used to optimize the performance of focusing X‐ray optical components.