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An X‐ray spectrometer for inelastic scattering experiments. III. Design and performance
Author(s) -
Pattison P.,
Suortti P.,
Weyrich W.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886089239
Subject(s) - spectrometer , optics , inelastic scattering , synchrotron radiation , physics , scattering , synchrotron , bent molecular geometry , detector , materials science , composite material
In papers I and II of the present series [Suortti, Pattison & Weyrich (1986). J. Appl. Cryst. 19 , 336–342, 343–352] a treatment of the X‐ray optics of elastically bent perfect crystals was given. These results are now used to optimize the design of an X‐ray spectrometer for inelastic scattering experiments, i.e. for the study of Compton and X‐ray Raman scattering. A spectrometer of this type has been constructed and tested. The intensity data and test spectra presented here provide a basis for evaluating the spectrometer performance. A comparison is made with conventional apparatus using a γ ‐ray source and solid‐state detector, as well as a crystal spectrometer operating with a synchrotron radiation source.