Rapid collection of X‐ray powder data for pattern analysis by a cylindrical position‐sensitive detector

An apparatus has been developed which permits rapid collection of X‐ray powder diffraction data for structure refinement by pattern analysis. The apparatus is built on a cylindrical position‐sensitive detector with an angular aperture of 120° and resolution of 0.05° in 2 θ . The detector uses a metal blade as anode and works in the self‐quenching streamer mode of gas ionization. A wide‐angle powder pattern can be recorded simultaneously from a stationary specimen, where geometrical broadening of reflection lines is suppressed by limiting the angular width of the incident beam. A test made with standard corundum powder shows that a diffraction pattern with a substantially better resolution is obtainable in one‐eightieth the time compared with a normal θ –2 θ diffractometer. The usefulness of the apparatus in high‐temperature work has been demonstrated in profile refinement of structural parameters for the δ phase of bismuth oxide at 1057 K.