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Rapid collection of X‐ray powder data for pattern analysis by a cylindrical position‐sensitive detector
Author(s) -
Shishiguchi S.,
Minato I.,
Hashizume H.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886089008
Subject(s) - detector , angular resolution (graph drawing) , materials science , optics , powder diffractometer , diffraction , diffractometer , powder diffraction , resolution (logic) , phase (matter) , beam (structure) , physics , nuclear magnetic resonance , scanning electron microscope , mathematics , combinatorics , quantum mechanics , artificial intelligence , computer science
An apparatus has been developed which permits rapid collection of X‐ray powder diffraction data for structure refinement by pattern analysis. The apparatus is built on a cylindrical position‐sensitive detector with an angular aperture of 120° and resolution of 0.05° in 2 θ . The detector uses a metal blade as anode and works in the self‐quenching streamer mode of gas ionization. A wide‐angle powder pattern can be recorded simultaneously from a stationary specimen, where geometrical broadening of reflection lines is suppressed by limiting the angular width of the incident beam. A test made with standard corundum powder shows that a diffraction pattern with a substantially better resolution is obtainable in one‐eightieth the time compared with a normal θ –2 θ diffractometer. The usefulness of the apparatus in high‐temperature work has been demonstrated in profile refinement of structural parameters for the δ phase of bismuth oxide at 1057 K.