Premium
A new method for determination of the crystal setting matrix for interpreting oscillation photographs
Author(s) -
Sarma R.,
McKeever B.,
Gallo R.,
Scuderi J.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886088908
Subject(s) - oscillation (cell signaling) , crystal (programming language) , graphics , optics , microcomputer , orientation (vector space) , matrix (chemical analysis) , diffraction , computer graphics (images) , principal axis theorem , computer science , beam (structure) , physics , materials science , geometry , mathematics , chemistry , telecommunications , biochemistry , chip , composite material , programming language
The standard procedure for indexing oscillation photographs makes use of the partial reflections from two Laue photographs of a crystal taken with the incident beam parallel to any two principal axes of the crystal. A procedure is described using a graphics terminal of a microcomputer to display the calculated and observed diffraction patterns for an oscillation photograph and to examine visually all necessary rotations to get the best orientation matrix for the crystal. This method is particularly useful when the crystal is sensitive to X‐rays and not easily amenable to setting photographs or Laue photographs.