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Use of kinematical diffraction in X‐ray topography
Author(s) -
Alexandropoulos N. G.,
Kotsis K. T.
Publication year - 1985
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889885010792
Subject(s) - diffraction , diffractometer , diffraction topography , bragg's law , optics , x ray crystallography , crystal (programming language) , x ray , materials science , intensity (physics) , physics , surface (topology) , crystallography , geometry , chemistry , mathematics , computer science , scanning electron microscope , programming language
A new X‐ray topographic method is proposed that makes use of the kinematical diffraction component, which is significantly more sensitive to the crystal‐surface imperfections than dynamical Laue–Bragg diffraction. The sensitivity of the method has been studied using a triple crystal diffractometer to separate kinematical and dynamical components of the diffraction intensity curve when the Bragg condition is nearly satisfied.