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Programmed crystal growth on a diffractometer with focused heat radiation
Author(s) -
Brodalla D.,
Mootz D.,
Boese R.,
Osswald W.
Publication year - 1985
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988501038x
Subject(s) - diffractometer , halogen lamp , materials science , radiation , capillary action , optics , melting point , optoelectronics , physics , composite material , scanning electron microscope
To improve the growing of single crystals for structural analysis, especially those of low‐melting‐point materials, a new technique and the appropriate apparatus have been developed. The heat radiation of a halogen lamp of adjustable intensity is focused by a parabolic mirror on the sample capillary, which is mounted on a diffractometer and cooled by a gas stream at a controlled temperature. The focus can be moved along the length of the capillary in any direction, for horizontal or vertical miniature zone melting or Bridgman techniques. The heat source and the movable mirror are controlled by a microprocessor, which allows systematic and software‐supported search and reproduction of suitable experimental growing conditions.