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Electron optical study of rutile
Author(s) -
Creek R. C.,
Spargo A. E. C.
Publication year - 1985
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889885010159
Subject(s) - rutile , electron diffraction , diffraction , allowance (engineering) , orientation (vector space) , crystal (programming language) , electron microscope , optics , space (punctuation) , resolution (logic) , materials science , electron , crystallography , reflection high energy electron diffraction , electron backscatter diffraction , basis (linear algebra) , group (periodic table) , molecular physics , physics , chemistry , geometry , mathematics , quantum mechanics , computer science , mechanical engineering , artificial intelligence , programming language , engineering , organic chemistry , operating system
Convergent‐beam electron diffraction has been used to confirm the accepted space group of rutile (TiO 2 ) and to study in detail the dependence of the intensity of the space‐group‐forbidden reflections on crystal thickness and orientation. The observations are shown to be in detailed agreement with computer‐simulated patterns calculated using the standard structural parameters. The diffraction results provide a basis for understanding the high‐resolution electron‐microscope images of rutile crystals oriented close to the [001] zone in which the effects of the space‐group‐forbidden reflections are important. It is concluded that satisfactory agreement exists between experimental and calculated images provided that allowance is made for uncertainty in the orientation of the crystal.