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A two‐crystal X‐ray interferometer from different pieces of silicon material
Author(s) -
Becker P.
Publication year - 1985
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889885009931
Subject(s) - silicon , interferometry , x ray , materials science , crystal (programming language) , optics , crystallography , physics , optoelectronics , chemistry , computer science , programming language
It is shown that an X‐ray interferometer consisting of two crystals cut from different pieces of silicon material can be successfully operated. The dependence of the visibility of the interference pattern on different thicknesses of beam splitter and analyzer is investigated.