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In situ alignment procedure for X‐ray topography
Author(s) -
Forman R. A.,
Mayo S.
Publication year - 1985
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889885009906
Subject(s) - rotation (mathematics) , reflection (computer programming) , surface (topology) , optics , x ray , in situ , bragg's law , materials science , crystal (programming language) , geometry , crystallography , physics , diffraction , chemistry , computer science , mathematics , meteorology , programming language
A simple method for in situ alignment of samples in a double‐crystal X‐ray topography system is described. This method permits a specific crystallographic axis to be made coincident with the sample rotation axis used to set the Bragg angle. Surface reflections from approximately orthogonal crystallographic planes are required and tables of such planes suitable for alignment of cubic crystals are given. This procedure allows rapid setup for the other accessible surface reflection or transmission topographs.