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Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relation
Author(s) -
Hoyt J. J.,
De Fontaine D.,
Warburton W. K.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884011626
Subject(s) - scattering , synchrotron radiation , dispersion relation , dispersion (optics) , interferometry , spectral line , materials science , optics , anomalous scattering , absorption (acoustics) , kramers–kronig relations , analytical chemistry (journal) , physics , computational physics , atomic physics , chemistry , quantum mechanics , refractive index , chromatography
X‐ray absorption spectra about the K edges of Ni, Cu and Ti have been measured at the Stanford Synchrotron Radiation Laboratory. The imaginary part of the atomic scattering factor f ′′ was determined using the optical theorem and the real part f ′ computed by the Kramers–Kronig dispersion relation. Methods for evaluating this integral as well as the effects on f ′ of various experimental errors are investigated. The f ′ results for Cu and Ni are compared to data from interferometry experiments.