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A new high‐resolution small‐angle X‐ray scattering apparatus using a fine‐focus rotating anode, point‐focusing collimation and a position‐sensitive proportional counter
Author(s) -
Yoda O.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884011614
Subject(s) - optics , collimated light , physics , scattering , resolution (logic) , photon , anode , bent molecular geometry , x ray , materials science , laser , electrode , quantum mechanics , artificial intelligence , computer science , composite material
A high‐resolution small‐angle X‐ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small‐angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs −1 is obtained on the sample with the rotating‐anode X‐ray generator operated at 40 kV–30 mA. (iv) Incident X‐rays are monochromated by a bent quartz crystal, which makes the determination of the incident X‐ray intensity simple and unambiguous. (v) By rotation of the position‐sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.