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High‐resolution measurements of angle‐resolved X‐ray scattering from optically flat mirrors
Author(s) -
Matsushita T.,
Ishikawa T.,
Kohra K.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988401147x
Subject(s) - specular reflection , optics , angular resolution (graph drawing) , scattering , reflection (computer programming) , collimator , total internal reflection , resolution (logic) , physics , intensity (physics) , beam (structure) , acceptance angle , mathematics , combinatorics , artificial intelligence , computer science , programming language
With a compact arrangement using single‐crystal collimator and analyzer (silicon 220 reflection) of channel‐cut type, angle‐resolved scattering (ARS) curves of X‐rays (Cu Kα 1 ) for optically flat mirrors have been measured at various glancing angles, ω , of X‐rays to the mirror surface with an angular resolution of 4′′. Weak scattered intensity (10 −3 –10 −5 of the specularly reflected beam) is observed over an angular range of a few hundred arc s below and above the direction of specular reflection. When ω is close to the critical angle for total reflection, the scattered intensity at the low‐angle tail of ARS curves is higher than that at the high‐angle tail. This asymmetric tail profile of ARS curves is explained by simply superposing intensities of specularly reflected beams from surface elements inclined to each other.