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Determination of the spectral intensity distribution of the incident beam in energy‐dispersive X‐ray diffractometry
Author(s) -
Uno R.,
Ishigaki J.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884011225
Subject(s) - spectral power distribution , intensity (physics) , optics , radiant intensity , beam (structure) , detector , reflection (computer programming) , energy (signal processing) , materials science , x ray , atomic physics , physics , radiation , quantum mechanics , computer science , programming language
The measurement of the spectral intensity distribution of the incident beam in energy‐dispersive X‐ray diffractometry has been examined by several methods. The spectral distribution estimated from the integrated intensity of a well defined reflection at several energies is the most reliable. Three direct measurements of the spectral distribution by a solid‐state detector are also examined. Of these only the measurement at very low tube current can be used in structure factor determination, but the accuracy is about 5% even for strong reflections.