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Non‐focusing diffractometer for X‐ray studies on weakly absorbing amorphous materials
Author(s) -
Herms G.,
Hajdu F.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884011201
Subject(s) - diffractometer , optics , monochromator , materials science , x ray , spherical aberration , amorphous solid , crystallography , physics , chemistry , scanning electron microscope , wavelength , lens (geology)
One of the main sources of error when studying weakly absorbing materials using an X‐ray diffractometer with Bragg–Brentano focusing geometry is specimen transparency. Its undesired effects (peak displacement and loss of intensity in the medium angular range) can be avoided by using a slab‐like specimen in symmetrical transmission, in which case the type of diffractometer is more or less immaterial except that a non‐focusing diffractometer offers a series of advantages, e.g. a very simple lining‐up procedure and the possibility of using rod‐like specimens. Such a diffractometer with a flat monochromator in the primary beam is described and both the equatorial aberration and the axial aberration are discussed.