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Single‐peak methods for Fourier analysis of peak shapes
Author(s) -
Nandi R. K.,
Kuo H. K.,
Schlosberg W.,
Wissler G.,
Cohen J. B.,
Crist B.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884010943
Subject(s) - fourier analysis , fourier transform , diffraction , optics , simple (philosophy) , fourier series , distribution (mathematics) , materials science , physics , mathematics , mathematical analysis , philosophy , epistemology
Several procedures for Fourier analysis of single diffraction peaks for microstrains and mosaic sizes are compared. A simple new method works well, especially when the size distribution is broad, and/or when the strains vary in an unusual manner.