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Quantitative X‐ray phase analysis of surface layers
Author(s) -
Zevin L. S.,
Rozenak P.,
Eliezer D.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884010931
Subject(s) - diffraction , penetration (warfare) , materials science , phase (matter) , austenite , surface (topology) , distribution (mathematics) , penetration depth , x ray , analytical chemistry (journal) , optics , composite material , chemistry , physics , geometry , mathematics , microstructure , mathematical analysis , chromatography , organic chemistry , operations research
The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X‐rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations. The method was applied to the analysis of austenite distribution in cathodically charged stainless steel.