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Measurement of the polarization of X‐rays from a synchrotron source
Author(s) -
Materlik G.,
Suortti P.
Publication year - 1984
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889884010918
Subject(s) - wavelength , perpendicular , optics , polarization (electrochemistry) , synchrotron , synchrotron light source , synchrotron radiation , physics , linear polarization , diffraction , reflection (computer programming) , degree of polarization , beam (structure) , materials science , geometry , scattering , storage ring , laser , chemistry , mathematics , computer science , programming language
The vertical intensity distributions of X‐rays from a synchrotron source are measured by powder diffraction. The components polarized in the orbital plane and perpendicular to this plane are separated by measuring a reflection 90° to the vertical and horizontal planes, respectively. The measurements are made at three wavelengths between 0.65 λ c and λ c , where λ c is the characteristic wavelength. In each case, the degree of linear polarization reaches a maximum of 90% at the center of the beam. The results agree closely with calculations which use machine optical parameters.