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A novel curved position‐sensitive proportional counter for X‐ray diffractometry
Author(s) -
Wölfel E. R.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883011401
Subject(s) - diffractometer , monochromatic color , proportional counter , crystallite , optics , materials science , detector , range (aeronautics) , x ray , position (finance) , anode , powder diffractometer , phase (matter) , physics , analytical chemistry (journal) , diffraction , chemistry , electrode , composite material , scanning electron microscope , finance , quantum mechanics , economics , metallurgy , chromatography
A novel position‐sensitive detector (PSD) is described which has been used on the STOE focusing monochromatic beam diffractometer. The anode wire of the PSD coincides with the focusing circle of the diffractometer and covers a range of Δ 2 θ = 60°. Within a few minutes, data were collected from polycrystalline transmission samples and capillaries, and with a furnace as an attachment to the diffractometer phase transitions and solid‐state reactions were studied. Some of the results are discussed in this paper, the characteristics of the PSD are described and compared with conventional counters.