Premium
Application of in situ synchrotron X‐ray topography to the study of a solid‐phase transformation: crystallography of the transition in pure titanium
Author(s) -
Jourdan C.,
Gastaldi J.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883011231
Subject(s) - synchrotron radiation , synchrotron , in situ , materials science , crystallography , phase transition , titanium , x ray crystallography , phase (matter) , x ray , diffraction , optics , chemistry , physics , condensed matter physics , metallurgy , organic chemistry
With a high‐temperature camera, designed for in situ synchrotron radiation X‐ray topography, the crystallography of the α → β transition in titanium has been studied.