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Correction for escape in X‐ray spectra measured using a Ge detector
Author(s) -
Steenstrup S.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883011218
Subject(s) - detector , subtraction , spectral line , germanium , resolution (logic) , point (geometry) , physics , optics , energy (signal processing) , background subtraction , computational physics , semiconductor detector , x ray detector , computer science , geometry , mathematics , optoelectronics , silicon , artificial intelligence , arithmetic , pixel , quantum mechanics , astronomy
X‐ray spectra measured with a germanium detector can be corrected for escape. A numerical procedure to perform the correction has been implemented. The method employs a point by point subtraction and allows for energy‐dependent detector resolution.