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A double‐source double‐crystal X‐ray spectrometer for high‐sensitivity lattice‐parameter difference measurements
Author(s) -
Buschert R. C.,
Meyer A. J.,
Kauffman D. S.,
Gotwals J. K.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883011152
Subject(s) - sensitivity (control systems) , lattice (music) , optics , lattice constant , crystal (programming language) , x ray , materials science , spectrometer , sample (material) , crystal structure , thermal , computational physics , analytical chemistry (journal) , physics , crystallography , chemistry , diffraction , computer science , thermodynamics , chromatography , electronic engineering , acoustics , engineering , programming language
A method of measuring the difference between the lattice parameter of a region of an unknown sample and that of a region of a standard reference crystal to a sensitivity of 1 part in 10 9 is presented. Problems inherent in multiple‐beam arrangements due to sample strains and non‐uniformity have been overcome by the use of a new double‐source arrangement in which the two X‐ray beams sample the same spot on a crystal under study. Ways of identifying and preventing errors from significant mechanical and thermal effects arising in the sensitivity region explored are indicated.