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Eccentricity corrections for a modified Debye–Scherrer camera
Author(s) -
Frevel L. K.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988301095x
Subject(s) - diffraction , scherrer equation , debye , sample (material) , eccentricity (behavior) , optics , physics , x ray crystallography , bracketing (phenomenology) , materials science , condensed matter physics , thermodynamics , political science , law , philosophy , epistemology
By substituting a thin flat powder specimen for the conventional cylindrical sample in a modified Debye–Scherrer camera [Frevel, DeLeeuw & Albe (1982). Norelco Rep. 29 , 2, 38–39], well defined diffraction profiles representative of the entire sample are obtained. The peak of such a diffraction profile can be measured quite accurately so that for that reflection the effective center of the diffracting sample may be determined from the bracketing diffraction peaks of an internal standard.