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The doping method in quantitative X‐ray diffraction phase analysis. Addendum
Author(s) -
Popović S.,
GržetaPlenković B.,
BalićŽunić T.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010900
Subject(s) - addendum , doping , diffraction , component (thermodynamics) , phase (matter) , materials science , fraction (chemistry) , x ray crystallography , line (geometry) , x ray , analytical chemistry (journal) , crystallography , optics , chemistry , physics , thermodynamics , mathematics , geometry , optoelectronics , chromatography , organic chemistry , political science , law
A specific case of the doping method [Popović & Gržeta‐Plenković (1979). J. Appl. Cryst. 12 , 205–208] is elaborated, in which the weight fraction of a crystalline component in the multicomponent system can be determined from the measurement of diffraction line intensities of that component only. Optimum conditions to attain maximum accuracy of the doping method are discussed.