An absolute intensity standard for small‐angle X‐ray scattering measured with position‐sensitive detectors | Zendy

Russell T. P. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

An absolute intensity standard for small‐angle X‐ray scattering measured with position‐sensitive detectors

Author(s) -

Russell T. P.

Publication year - 1983

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889883010857

Subject(s) - intensity (physics) , detector , scattering , optics , position (finance) , materials science , small angle scattering , small angle x ray scattering , electron density , beam (structure) , cathode ray , electron , physics , nuclear physics , finance , economics

Silica sols have been evaluated as a means of determining the incident beam intensity using position‐sensitive detectors. Analysis of the total integrated small‐angle X‐ray scattering yielded an electron density of the suspended silica particles that was within 4% of the electron density of amorphous silica. The sols were found to be particularly well suited for use with position‐sensitive detectors and represent a convenient, rapid, and accurate means to determine the incident beam intensity.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research