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On‐line Fourier analysis of the shapes of X‐ray diffraction peaks
Author(s) -
Schlosberg W. H.,
Cohen J. B.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010481
Subject(s) - diffraction , fourier analysis , fourier transform , reflection (computer programming) , line (geometry) , operator (biology) , optics , fourier series , computational physics , physics , statistics , mathematics , mathematical analysis , computer science , chemistry , geometry , biochemistry , repressor , transcription factor , gene , programming language
A technique for on‐line data collection and Fourier analysis of diffraction profiles is described to obtain information on particle size and microstrain from multiple orders of a reflection or from a single peak. Equations are given for errors in these quantities due to counting statistics. Their use in determining these parameters to operator‐specified limits reduces the usual time required for data collection.