Premium
Certification of Si powder diffraction standard reference material 640a
Author(s) -
Hubbard C. R.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010456
Subject(s) - powder diffraction , crystallite , materials science , calibration , diffraction , certified reference materials , lattice constant , certification , lattice (music) , analytical chemistry (journal) , crystallography , optics , chemistry , metallurgy , chromatography , physics , mathematics , statistics , detection limit , acoustics , political science , law
A new lot of high‐purity silicon powder with mean crystallite size of about 6 μm has been certified as Standard Reference Material 640a. This SRM can be used as both an external and an internal 2 θ calibration standard. The lattice parameter, uncorrected for refraction, is a = 5.430825(11) for λ (Cu K α 1 ) = 1.5405981 Å at 298.1 K.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom