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X‐ray measurement of the static Debye–Waller factor of NbH x
Author(s) -
Behr H.,
Metzger H.,
Peisl J.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010328
Subject(s) - debye–waller factor , scattering , debye , x ray , lattice (music) , diffractometer , lattice constant , structure factor , materials science , debye length , crystal structure , condensed matter physics , physics , crystallography , chemistry , diffraction , optics , nuclear physics , acoustics , plasma
Integrated X‐ray Bragg intensities from Nb single crystals have been measured as a function of H concentration and scattering vector along high‐symmetry directions. The observed attenuation can be described in terms of a static Debye–Waller factor (DWF) due to the static displacements of the Nb lattice atoms around the dissolved H. The crystals were loaded with H in situ on the X‐ray diffractometer. The static DWF was determined from the ratio of the intensities from a crystal with and without H. Corrections are necessary for several magnitudes which change with the lattice‐parameter change and the change of the thermal displacements upon the uptake of H. The measured static DWF is proportional to the H concentration c (H/Nb) for c ≤0.30 and the square of the scattering vector K 2 for small K , as expected from theory. From analysis of the static DWF the static displacements of the Nb atoms closest to the H impurity u 1 = 0.1 Å were determined.