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X‐ray guide tube for diffraction experiments
Author(s) -
Nakazawa H.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010304
Subject(s) - diffraction , optics , brightness , x ray , reflection (computer programming) , tube (container) , wavelength , x ray tube , photon energy , materials science , total external reflection , crystal (programming language) , photon , physics , total internal reflection , electrode , anode , quantum mechanics , computer science , composite material , programming language
For diffraction experiments with an extremely small crystal or with very long distance from X‐ray source to detecting instrument, the use of an `X‐ray guide tube' (XGT) is proposed on the basis of a simple consideration and experiment with a Pyrex‐glass tube. X‐ray intensities through an XGT of glass and also through a pin hole were measured as a function of photon energy and compared to derive the gain by use of XGT. At wavelengths between Cu K α and Mo K α radiations, the observed gain in brightness is about thirty to twenty for the present setup, corresponding to about 50 to 80% of the maximum possible gain calculated on the assumption that the reflectivity of X‐ray total external reflection is 1.0.

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