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A focusing X‐ray camera for recording low‐angle diffraction from small specimens
Author(s) -
Milch J. R.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010250
Subject(s) - optics , diffraction , shutter , physics , detector , focal length , beam (structure) , focus (optics) , image resolution , resolution (logic) , x ray , anode , bent molecular geometry , materials science , lens (geology) , computer science , electrode , quantum mechanics , artificial intelligence , composite material
An X‐ray camera is required in many low‐angle diffraction experiments to focus the X‐ray beam incident on the specimen. This paper describes an X‐ray camera designed to record two‐dimensional diffraction data from small specimens with unit cells as large as 50 nm. It matches the 200 μm focal spot of a rotating‐anode X‐ray generator to an electro‐optical detector with a spatial resolution of 300 μm. The camera is very flexible and can accommodate a total source‐to‐detector distance of 2.5 m. The X‐ray beam is focused by two 20 cm mirrors bent by simple two‐point benders. The theory of such benders and the design of X‐ray cameras incorporating them is discussed briefly. The paper also describes a fast (1 ms) X‐ray shutter and simple ion chambers useful for alignment and operation.