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Microdiffraction from stacking faults and twin boundaries in F.c.c. crystals
Author(s) -
Zhu J.,
Cowley J. M.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883010213
Subject(s) - stacking , planar , materials science , diffraction , electron diffraction , crystallography , stacking fault , condensed matter physics , molecular physics , optics , chemistry , physics , nuclear magnetic resonance , computer graphics (images) , computer science
Electron microdiffraction patterns have been obtained from regions of diameter about 15 Å in thin crystals of stainless steel containing twin boundaries and stacking faults. The diffraction spots show splittings which are characteristic of the type of defect present as a result of interference effects in the coherent convergent electron beam. The observations of spot splitting are in good agreement with calculations based on simple theoretical models. In conjunction with previous work on antiphase domain boundaries [Zhu & Cowley (1982). Acta Cryst. A 38 , 718–724] these results suggest that the observation of spot splitting is of general relevance for the study of all planar faults in thin crystals.