Defect structure analysis of polycrystalline materials by computer‐controlled double‐crystal diffractometer with position‐sensitive detector

The method represents an extension of a previously developed X‐ray double‐crystal diffractometer method when a film was used to record the crystallite reflections, each reflecting crystallite being regarded as the second crystal of a double‐crystal diffractometer. By utilizing a position‐sensitive detector (PSD) with interactive computer controls, the tedious and limiting task of data acquisition and analysis is greatly simplified. The specimen is irradiated with crystal‐monochromated radiation and the numerous microscopic spots emanating from the reflecting crystallites are recorded separately by the position‐sensitive detector and its associated multichannel analyzer at each increment of specimen rotation. An on‐line minicomputer simultaneously collects these data and applies the necessary corrections. This process is then automatically repeated through the full rocking‐curve range. The computer carries out the rocking‐curve analysis of the individual crystallite reflections as well as that of the entire reflecting crystallite population. The instrument is provided with a specimen translation device which permits analysis of large sections of solid specimens. Thus, sites of local lattice defects induced either mechanically, chemically or by radiation can rapidly be established and quantitatively determined in terms of rocking‐curve parameters as well as imaged by X‐ray topography, by inserting a film in front of the PSD. The versatility and usefulness of the method is demonstrated by examples given from studies of fracture, fatigue and stress‐corrosion cracking of commercial alloys.