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Powder diffraction by layered minerals containing different layers and/or stacking defects. Comparison between Markovian and non‐Markovian models
Author(s) -
Plançon A.,
Drits V. A.,
Sakharov B. A.,
Gilan Z. I.,
Brahim J. B.
Publication year - 1983
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889883009954
Subject(s) - stacking , diffraction , layer (electronics) , component (thermodynamics) , markov process , materials science , crystal (programming language) , powder diffraction , crystallography , chemistry , thermodynamics , physics , nanotechnology , computer science , optics , mathematics , statistics , organic chemistry , programming language
The models used up to now for the calculation of powder patterns of layer minerals containing defects have adopted a Markovian hypothesis for the law of defect occurrence. One consequence of this hypothesis is that in a powder obeying this law the particles differ in their contents (chemical composition and/or abundance of stacking defects). Another model can be considered in which the particles have identical contents of each type of layers or stacking defects. This is denoted here by the `identical contents crystal model' (ICC model). In this article are described: (i) the calculation of diffracted intensities for the ICC model and its comparison with that of the Markovian one, and (ii) the application of this calculation to a two‐component mixed‐layer system. It is shown which kind of modification of intensities or peak positions occur with the ICC model for thin crystals.