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A coordinate X‐ray diffractometer based on a two‐dimensional proportional chamber and a two‐circle goniometer
Author(s) -
Andrianova M. E.,
Kheiker D. M.,
Popov A. N.,
Simonov V. I.,
Anisimov Y. S.,
Chernenko S. P.,
Ivanov A. B.,
Movchan S. A.,
Peshekhonov V. D.,
Zanevsky Y. V.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882012801
Subject(s) - diffractometer , goniometer , optics , resolution (logic) , diffraction , x ray , materials science , physics , crystal (programming language) , image resolution , crystallography , chemistry , computer science , scanning electron microscope , artificial intelligence , programming language
A coordinate X‐ray diffractometer based on a flat two‐coordinate multiwire proportional chamber 350 × 350 × 10 mm and information readout from cathode printed‐circuit delay lines is described. The diffractometer is used to study macromolecular single crystals. The chamber is placed on a two‐circle goniometer at distances of 300, 500 and 750 mm from the crystal. The diffractometer operates on‐line with an SM‐2 computer. A diffraction picture is collected in a 64 K 16‐bit word computer core memory with the maximum count rate of 250000 events s −1 . The detection quantum efficiency of Cu K α radiation is about 70%. The number of spatial resolution elements of a diffraction picture is ~ 50000, the resolution time ~ 0.5 μs. The general case of inclined geometry is used. The diffraction picture is collected during quasi‐continuous scanning. Control of the diffractometer, data collection and pre‐computing X,Z are performed at the same time. The diffractometer makes it possible to study single crystals having unit cells up to 250 Å at a resolution of 3.5 Å and to 84 Å at a resolution of 1.5 Å.