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Use of the Voigt function in a single‐line method for the analysis of X‐ray diffraction line broadening
Author(s) -
De Keijser Th. H.,
Langford J. I.,
Mittemeijer E. J.,
Vogels A. B. P.
Publication year - 1982
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889882012035
Subject(s) - voigt profile , diffraction , crystallite , line (geometry) , interpolation (computer graphics) , materials science , asymmetry , x ray crystallography , function (biology) , nickel , alloy , x ray , analytical chemistry (journal) , optics , chemistry , mathematics , physics , metallurgy , spectral line , geometry , classical mechanics , chromatography , quantum mechanics , evolutionary biology , biology , motion (physics) , astronomy
The use of the Voigt function for the analysis of the integral breadths of broadened X‐ray diffraction line profiles forms the basis of a rapid and powerful single‐line method of crystallite‐size and strain determination which is easy to apply. To avoid graphical methods or interpolation from tables, empirical formulae of high accuracy are used and an estimation of errors is presented, including the influence of line‐profile asymmetry. The method is applied to four practical cases of size‐strain broadening: (i) cold‐worked nickel, (ii) a nitrided steel, (iii) an electrodeposited nickel layer and (iv) a liquid‐quenched AlSi alloy.